A Device for Carrying Out High-Precision Measurements of Small-Angle X-Ray Scattering on Liquid Samples : научное издание

Описание

Тип публикации: статья из журнала

Год издания: 2026

Идентификатор DOI: 10.1134/S0020441226700156

Аннотация: A liquid sample holder for small-angle X-ray scattering measurements has been developed and tested that allows for a significant increase in the signal-to-noise ratio with a small amount of sample material. The proposed device consists of a vertically positioned capillary made of a chemically resistant material with a diameter of 0Показать полностью.005–5.0 mm, the lower edge of which is rigidly fixed above the center of the incident X‑ray beam at a distance equal to the radius of the drop. A drop of liquid sample is squeezed out through the lower end of the capillary. Surface tension forces ensure the spherical shape of the droplet and hold it at the end of the capillary. The scattering of a beam passing through a drop is axisymmetric since the spherical shape of the sample drop best meets this requirement. The presence of a sample in such a device eliminates the presence of additional elements in the radiation beam that could introduce distortions into the signal, which allows for high-precision measurements using the small-angle X-ray scattering method. Test measurements were carried out that showed a significantly more isotropic scattering pattern, and the optimal relative positions of the radiation beam and the sample drop were determined. The simplicity of the proposed holder design and its versatility for measuring various samples are undeniable advantages.

Ссылки на полный текст

Издание

Журнал: Instruments and Experimental Techniques

Выпуск журнала: Т. 69, № 1

Номера страниц: 228-233

ISSN журнала: 00204412

Место издания: Moscow

Издатель: Pleiades Publishing, Ltd.

Персоны

  • Zabluda V.N. (Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences)
  • Ivanova O.S. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences)
  • Edelman I.S. (Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences)
  • Kichkailo A.S. (Voyno-Yasenetsky Krasnoyarsk State Medical University)
  • Moryachkov R.V. (Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences)

Вхождение в базы данных