In-situ ellipsometric characterization of the growth of porous anisotropic nanocrystalline ZnO layers : научное издание

Описание

Тип публикации: статья из журнала

Год издания: 2015

Идентификатор DOI: 10.1063/1.4913909

Ссылки на полный текст

Издание

Журнал: Applied Physics Letters

Выпуск журнала: Т. 106, 10

Номера страниц: 101904

ISSN журнала: 00036951

Издатель: American Institute of Physics

Персоны

  • Laha P. (Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel)
  • Terryn H. (Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel)
  • Ustarroz J. (Research Group Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel)
  • Nazarkin M.Y. (Department of Materials of Functional Electronics (MFE), National Research University of Electronic Technology, Bld. 5)
  • Gavrilov S.A. (Department of Materials of Functional Electronics (MFE), National Research University of Electronic Technology, Bld. 5)
  • Volkova A.V. (Department of Quantum Physics and Nanoelectronics (QPN), National Research University of Electronic Technology, Bld. 5)
  • Simunin M.M. (Department of Quantum Physics and Nanoelectronics (QPN), National Research University of Electronic Technology, Bld. 5)

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